The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7075086 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 11, 2006

Filed:

Aug. 28, 2003
Applicants:

Paul H. Shelley, Lakewood, WA (US);

Bruce R. Davis, Seattle, WA (US);

Inventors:

Paul H. Shelley, Lakewood, WA (US);

Bruce R. Davis, Seattle, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A value of infrared energy reflected from a metallic substrate with a polished surface is determined. The value of the infrared energy reflected, or conversely absorbed, is correlated to a quality of polish. According to an aspect of the invention, one embodiment of the invention utilizes an infrared spectrometer to determine the infrared absorbance of a polished metallic substrate. An infrared beam is reflected off the metallic substrate. The infrared energy of the reflected beam is compared with a pre-determined value of infrared energy reflected off a reference polish surface.


Find Patent Forward Citations

Shelley, Paul. (2006). Measurement of metal polish quality (U.S. Patent No. 7075086). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7075086

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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