The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2006

Filed:

Dec. 08, 2004
Applicant:

Nitin M. Vaidya, Shrewsbury, MA (US);

Inventor:

Nitin M. Vaidya, Shrewsbury, MA (US);

Assignee:

Millivision Technologies, Amherst, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Output value signals from radiometer or receiver channels are normalized to achieve a flat field response when creating a millimeter wave image. A normalizing factor is applied to the output value signals from each channel, and the normalizing factor accommodates drift in offset of the output value signals on a scan-by-scan basis. The normalizing factor is based on each channel observing a different mean scan brightness temperature from a portion of the scene than the mean brightness temperature of the entire scene. The normalizing factor is obtained by solving a system of simultaneous equations in which normalizing factors from all of the channels are related to one another, preferably by a consistency condition where the mean scan temperature of each channel is equal to an average of the intensities of those image pixels to which the output value signals from that channel contributes.


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