The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Mar. 28, 2003
Diane Chinn, Pleasanton, CA (US);
Christopher J. Stolz, Lathrop, CA (US);
Zhouling Wu, Pleasanton, CA (US);
Robert Huber, Discovery Bay, CA (US);
Carolyn Weinzapfel, Tracy, CA (US);
Diane Chinn, Pleasanton, CA (US);
Christopher J. Stolz, Lathrop, CA (US);
Zhouling Wu, Pleasanton, CA (US);
Robert Huber, Discovery Bay, CA (US);
Carolyn Weinzapfel, Tracy, CA (US);
The United States of America as represented by the United States Department of Energy, Washington, DC (US);
Abstract
Photothermal Imaging Scanning Microscopy produces a rapid, thermal-based, non-destructive characterization apparatus. Also, a photothermal characterization method of surface and subsurface features includes micron and nanoscale spatial resolution of meter-sized optical materials.