The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2006

Filed:

Aug. 27, 2003
Applicant:

Toshiaki Nagai, Kawasaki, JP;

Inventor:

Toshiaki Nagai, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02F 1/01 (2006.01); H10J 40/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

Provided is a measuring device which has a focusing unit for focusing light flux from a light source and irradiating it to a magnetic substance to be measured, a half-turn asymmetric element acting only on the light flux reflected by the magnetic substance to be measured and acting in such a manner that its action on polarization distribution in a cross section of the light flux has asymmetry nature about half-turn around an optical axis in order to obtain sensitivity to in-plane magnetization vector components of the magnetic substance to be measured, and a polarization split detector for detecting a light amount of a polarization component in one direction or separated each component of polarization components orthogonal to each other of the light which receives action of the half-turn asymmetric element so that the in-plane magnetization vector component in one direction can be measured separately from other components.


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