The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Mar. 01, 2005
Ehud Gal, Reut, IL;
Reuven Eyal, Ramat HaSharon, IL;
Gil Graisman, Reut, IL;
Gennadiy Liteyga, Ashkelon, IL;
Ehud Gal, Reut, IL;
Reuven Eyal, Ramat HaSharon, IL;
Gil Graisman, Reut, IL;
Gennadiy Liteyga, Ashkelon, IL;
Wave Group Ltd., Tel Aviv, IL;
Abstract
A method for determining azimuth and elevation angles of a radiation source or other physical objects located anywhere within an cylindrical field of view makes use of an omni-directional imaging system comprising of reflective surfaces, an image sensor and an optional optical filter for filtration of the desired wavelengths. The imaging system is designed to view an omni-directional field of view using a single image sensor and with no need for mechanical scan for coverage of the full field of view. Use of two such systems separated by a known distance, each providing a different reading of azimuth and elevation angle of the same object, enables classic triangulation for determination of the actual location of the object. The invention is designed to enable use of low cost omni-directional imaging systems for location of radiation sources or objects.