The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Jun. 11, 2001
Applicants:
Alois Lugstein, Vienna, AT;
Emmerich Bertagnolli, Vienna, AT;
Christine Kranz, Atlanta, GA (US);
Boris Mizaikoff, Atlanta, GA (US);
Inventors:
Alois Lugstein, Vienna, AT;
Emmerich Bertagnolli, Vienna, AT;
Christine Kranz, Atlanta, GA (US);
Boris Mizaikoff, Atlanta, GA (US);
Assignee:
Innovationsagentur Gesellschaft, Wein, AT;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B44C 1/22 (2006.01); G01N 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of producing a device for simultaneously carrying out an electrochemical and a topographical near field microscopy is disclosed, which is characterized in that a probe suitable for topographic near field microscopy is covered by a conductive material, the conductive material is covered by an insulating layer, and the conductive material and the insulating layer are removed in the region of the immediate tip of the probe.