The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 11, 2006
Filed:
Jan. 26, 2004
Yoshinobu Hosoi, Gamagori, JP;
Yoshinobu Hosoi, Gamagori, JP;
Nidek Co., Ltd., Gamagori, JP;
Abstract
An optometric apparatus for subjectively examining visual functions of an eye (PE) of an examinee is disclosed. This apparatus includes: a disposing unit () for disposing an optical element () in front of the examinee's eye; a cornea position alignment optical system () for checking a vertex distance between a back surface of the disposed optical element and a corneal vertex of the examinee's eye; wherein the alignment optical system includes an aligning scale plate () provided with a scale (S–S) for checking the vertex distance, a reticle plate () provided with a reticle () and placed in a different place from the aligning scale plate, and a first reference mark () and a second reference mark () for positioning an eye (OE) of an examiner in a point at a predetermined distance from the reticle plate, the first and second reference marks being provided in different places and appearing, to the examiner's eye, to have a predetermined positional relation with each other when the examiner's eye is positioned in the point at the predetermined distance from the reticle plate.