The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 11, 2006

Filed:

Jan. 30, 2002
Applicants:

Eric L. Burch, San Diego, CA (US);

Jaime G. Jurrens, San Diego, CA (US);

Dan M. Weeks, Poway, CA (US);

Nils Miller, San Diego, CA (US);

Inventors:

Eric L. Burch, San Diego, CA (US);

Jaime G. Jurrens, San Diego, CA (US);

Dan M. Weeks, Poway, CA (US);

Nils Miller, San Diego, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B41J 29/38 (2006.01); B41J 2/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatuses are provided for use in printing devices. In certain implementations, ink is printed to a first area of a print medium and a second area of the print medium. The ink is applied to the first area at a higher density than the second area. A first light scattering intensity value is measured from the first area and a second light scattering intensity value is measured from the second area. The print medium is categorized based on a comparison of the light scattering intensity values.


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