The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2006

Filed:

May. 20, 2004
Applicants:

Takeki Okamoto, Odawara, JP;

Mikio Fukuoka, Odawara, JP;

Inventors:

Takeki Okamoto, Odawara, JP;

Mikio Fukuoka, Odawara, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 12/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention relates to provide a technology which can detect a disk drive with degradation in the performance even if the disk drive itself does not comprise a function to detect degradation in the performance and which can realize a disk array apparatus which meets a request of a customer by changing a detection level of the degradation in the performance. In the apparatus, a disk controller: generates logical storage areas used for writing or reading data and having redundancy to store data, using the storage areas in the plurality of disk drive; monitors the storing areas in which a request for writing/reading data into/from the plurality of disk drives forming the logical storage areas is stored; and specifies, among the plurality of disk drives forming the logical storage areas, a disk drive having a large number of repeated times and block the specified disk drive.


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