The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Apr. 01, 2003
Partha Sarathi Routh, Houston, TX (US);
Phil D. Anno, Houston, TX (US);
Robert T. Baumel, Ponca City, OK (US);
Partha Sarathi Routh, Houston, TX (US);
Phil D. Anno, Houston, TX (US);
Robert T. Baumel, Ponca City, OK (US);
ConocoPhillips Company, Houston, TX (US);
Abstract
The present invention provides for a method and apparatus for seismic data processing. Prestack seismic data is obtained that contains a plurality of reflectors. Non-parallel moveout of the plurality of reflectors is utilized to determine a source wavelet using an L2-Norm and a reflectivity parameter using an L1-Norm. The source wavelet and reflectivity parameters can be determined simultaneously. Source and reflectivity determination may further comprise minimization of a model objective function. The model objective function may be a function of at least one of i) said source wavelet, ii) a gradient parameter and iii) an intercept parameter. An AVO intercept and gradient parameters can be determined using the determined source wavelet and reflectivity parameter. Constraints may be placed on parameters to ensure physically realistic solutions.