The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Apr. 03, 2001
Larry D. Barto, Austin, TX (US);
Steven C. Nettles, Johnson City, TX (US);
Yiwei LI, Austin, TX (US);
Larry D. Barto, Austin, TX (US);
Steven C. Nettles, Johnson City, TX (US);
Yiwei Li, Austin, TX (US);
Advanced Micro Devices, Sunnyvale, CA (US);
Abstract
A system and method are provided for monitoring work in process ('WIP') in a manufacturing facility. The system and method utilize software objects to identify a bottleneck workstation and calculate a WIP value representing the amount of work approaching the bottleneck workstation. If it is determined that the WIP value for a bottleneck workstation is projected to fall below a control limit during the evaluation period, an additional amount of work is released into the manufacturing line. In this manner, new work is introduced to a bottleneck station in order to prevent bottleneck starvation. Various embodiments provide for multiple products and multiple bottleneck workstations.