The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Dec. 28, 2001
Applicant:
Tilo Lilienblum, Magdeburg, DE;
Inventor:
Tilo Lilienblum, Magdeburg, DE;
Assignee:
INB Vision AG, Magdeburg, DE;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of defining deviations from a desired position of pixel sites in an image recording matrix by defining the 3-D data of a planar or slightly curved surface. To the extent necessary the results are smoothed, and the measuring points, utilizing the 3-D data, are projected back the sensors of the image recording matrix for determining the difference between the two points projected onto the sensors and associated with a 3-D measuring point. After selectively shifting the surface relative to the 3-D measuring system, prior method steps are repeated until the desired accuracy in the definition of the deviation has been has been attained.