The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Jun. 30, 2004
Michael J. Cullen, Discovery Bay, CA (US);
Carl R. Messenger, Mission Viejo, CA (US);
Michael J. Cullen, Discovery Bay, CA (US);
Carl R. Messenger, Mission Viejo, CA (US);
Western Digital Technologies, Inc., Lake Forest, CA (US);
Abstract
A method for identifying defective data sectors in a disk drive comprising generating a test pattern on a portion of a disk surface; reading the test pattern on the portion to detect an error and if an error is detected: associating the error with a physical location on the portion to identify a defective area unsuitable for user data; and assigning a severity category to the defective area. The method further comprises providing a physical defect list (P-list) for listing each defective area, the P-list having a predetermined limit to restrict a number of P-list entries; and posting the defective areas having a first severity category to the P-list and if the P-list limit is not exceeded by the first severity category entries: posting defective areas having a second severity category to the P-list.