The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Feb. 07, 2005
Hiroyuki Suhara, Kanagawa, JP;
Satoru Itoh, Kanagawa, JP;
Tatsuya Ito, Tokyo, JP;
Takeshi Ueda, Tokyo, JP;
Yoshinori Hayashi, Kanagawa, JP;
Magane Aoki, Kanagawa, JP;
Kenichi Takanashi, Chiba, JP;
Takao Yamaguchi, Kanagawa, JP;
Taira Kouchiwa, Kanagawa, JP;
Koji Hirakura, Kanagawa, JP;
Seizo Suzuki, Kanagawa, JP;
Hiroyuki Suhara, Kanagawa, JP;
Satoru Itoh, Kanagawa, JP;
Tatsuya Ito, Tokyo, JP;
Takeshi Ueda, Tokyo, JP;
Yoshinori Hayashi, Kanagawa, JP;
Magane Aoki, Kanagawa, JP;
Kenichi Takanashi, Chiba, JP;
Takao Yamaguchi, Kanagawa, JP;
Taira Kouchiwa, Kanagawa, JP;
Koji Hirakura, Kanagawa, JP;
Seizo Suzuki, Kanagawa, JP;
Ricoh Company, Ltd., Tokyo, JP;
Abstract
An optical scanning lens is used in a scanning and image forming optical system which gathers a light flux deflected by a light deflector in the vicinity of a surface to be scanned. The lens is formed by plastic molding of polyolefin resin, and the following condition is satisfied: 0<|Δn(x)−min[Δn(x)]|<34×10, where Δn(x) denotes a refractive-index distribution existing inside the lens, in a range which the light flux passes through, in the lens, and min[Δn(x)] denotes the minimum value of the Δn(x).