The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Aug. 18, 2003
Kazuyuki Okamura, Tokyo, JP;
Nobuaki Kitajima, Tokyo, JP;
Kazuyuki Okamura, Tokyo, JP;
Nobuaki Kitajima, Tokyo, JP;
Kabushiki Kaisha Topcon, Tokyo, JP;
Abstract
Provided is an operation microscope capable of obtaining bright and wide range red reflex on an observation image. Further, an operation microscope suitable for an observation of a retina and a vitreous body is provided. A pair of deflection members composed of two deflection mirrors are provided as a deflection means for deflecting illumination light guided from a light source to the vicinity of an optical axis of an observation optical system and guiding it to an eye to be operated through an objective lens. The deflection mirrors are disposed to sandwich the optical axis therebetween and simultaneously guide the illumination lights to the eye to be operated at substantially the same oblique angles with respect to the optical axis from the respective opposite sides. In addition, a stereo variator is made insertable onto the observation optical axis, so that relative positions of optical axes of right and left observation fluxes can be changed.