The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2006

Filed:

Aug. 04, 2003
Applicants:

Tianyu Xie, Shibuya-ku, JP;

Akio Uchiyama, Shibuya-ku, JP;

Atsushi Okawa, Shibuya-ku, JP;

Inventors:

Tianyu Xie, Shibuya-ku, JP;

Akio Uchiyama, Shibuya-ku, JP;

Atsushi Okawa, Shibuya-ku, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An attachmentthat is proximal to an optical probeincludes probe information holding meansthat holds probe information such as a scanning technique and an optical path length or the like. When the optical probeis connected (attached) to an observing device, probe information detecting means included in the observing deviceautomatically detects the probe information held in the optical probe. Based on the detected probe information, a scanning technique and an optical path length of reference light are set to values suitable to an actually connected optical probe


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