The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Feb. 05, 2004
Mario Haselsteiner, Haibühl, DE;
Klaus Hofbeck, Neumarkt, DE;
Thomas Klement, Regensburg, DE;
Birgit Rösel, Regensburg, DE;
Arnd Stielow, Regensburg, DE;
Mario Haselsteiner, Haibühl, DE;
Klaus Hofbeck, Neumarkt, DE;
Thomas Klement, Regensburg, DE;
Birgit Rösel, Regensburg, DE;
Arnd Stielow, Regensburg, DE;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
Taking as a starting point known security apparatuses and their methods for distance-dependent initiation of functions in or at an object, the reliability of distance measurements is essentially increased by carrying out a series of distance measurements, an associated quality value (G) being calculated by a mathematical function in each case for the measuring results (M–M, R, R) of said distance measurements. Only those measured values which fall below a certain quality value (Krit) as a threshold value are generally accepted for an analysis in respect of initiating a distance-related function. Developments provide for selecting measured values beforehand with reference to a level measurement, in order to further increase the reliability, or applying methods of statistical analysis subsequently.