The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 04, 2006
Filed:
Sep. 11, 2003
Toshiyuki Nomura, Kyoto, JP;
Hiroji Kohsaka, Kyoto, JP;
Kennosuke Kojima, Kyoto, JP;
Ichiro Asano, Kyoto, JP;
Naoyuki Matsumoto, Kyoto, JP;
Toshiyuki Nomura, Kyoto, JP;
Hiroji Kohsaka, Kyoto, JP;
Kennosuke Kojima, Kyoto, JP;
Ichiro Asano, Kyoto, JP;
Naoyuki Matsumoto, Kyoto, JP;
HORIBA, Ltd., Kyoto, JP;
Abstract
A multi-component analyzing apparatus in which infrared light is irradiated to a measuring-subject sample S which is constituted by either measuring-subject components whose sorts or quantities are limited or by a mixed article made of said measuring-subject components; intensity of infrared light having respective wavelength ranges which are fitted to infrared absorption spectra of the respective measuring-subject components among such infrared light penetrated through the measuring-subject sample S is measured by employing a plurality of detectorstocorresponding thereto; and said multi-component analyzing apparatus is comprised of a calculation processing unitfor analyzing the infrared light intensity of the respective wavelength ranges so as to acquire concentration xto xof the respective measuring-subject components; wherein the calculation processing unitis capable of executing an analyzing process program P for executing analysis operations of the concentration xto xof the respective measuring-subject components by solving simultaneous equations which are constituted by equations having mutual interference correction terms used to correct interference adverse influences occurred among the respective measuring-subject components.