The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2006

Filed:

Jun. 16, 2003
Applicant:

Alan Young, Los Gatos, CA (US);

Inventor:

Alan Young, Los Gatos, CA (US);

Assignee:

Raytek Corporation, Santa Cruz, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for compensating for geometrical distortion of a thermal image, generated by an infrared line-scanner, caused by non-uniform motion of an image object that utilizes a calibration object and interactive software to form non-rectangular zone boundaries that compensate for image distortion.


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