The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2006

Filed:

Oct. 28, 2004
Applicants:

Robert A. Warner, New Port Richey, FL (US);

David L. Hanley, Clearwater, FL (US);

Inventors:

Robert A. Warner, New Port Richey, FL (US);

David L. Hanley, Clearwater, FL (US);

Assignee:

Tri-Tronics Company, Inc., Tampa, FL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

A self-calibrating photoelectric control system for use in a checkstand to control the starting and stopping of a conveyer belt utilized to move products closer to a checkout clerk. The self-calibrating photoelectric control system including a light source for emitting a light beam having an intensity, a photoelectric sensor for receiving light from the light source and for generating an output signal when the received light is equal to or greater than a light-state threshold of the photoelectric sensor; and a calibration circuit for automatically calibrating the sensitivity of the photoelectric control system to partial beam breaks after occurrence of any one of a plurality of predefined events. The calibration circuit is operative for performing a calibration process which adjusts the intensity of the light beam emitted by the light source such that the intensity is slightly greater than the light-state threshold of the photoelectric sensor. By repeatedly performing the calibration process at selected times, the present invention optimizes the detection of objects that partially block the light beam, and thereby greatly enhances the system's ability to detect translucent and low-profile products.


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