The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2006

Filed:

Jul. 02, 2003
Applicants:

Geoffrey Andrew Lindsay, Ridgecrest, CA (US);

Peter Zarras, Ridgecrest, CA (US);

John D. Stenger-smith, Ridgecrest, CA (US);

Inventors:

Geoffrey Andrew Lindsay, Ridgecrest, CA (US);

Peter Zarras, Ridgecrest, CA (US);

John D. Stenger-Smith, Ridgecrest, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08L 63/00 (2006.01); C08L 63/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

An electro-optic (EO) polymer that has a tunable index of refraction and are synthesized by the copolymerization a bisphenol monomer including a chromophoric structure and two diepoxy monomers. One diepoxy monomer includes at least one fluorine atom, and the second diepoxy monomer includes no fluorine atoms. The EO films are prepared by applying an electric field across the film as the film is heated to its glass transition temperature. The electric field is removed after cooling the film. The index of refraction of these nonlinear optical polymer materials is tuned between about 1.58 to about 1.66 (measured with light having a wavelength of about 1.3 microns).


Find Patent Forward Citations

Loading…