The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 04, 2006

Filed:

Dec. 30, 2002
Applicants:

Youqi Wang, Atherton, CA (US);

Peijun Cong, San Jose, CA (US);

Tony N. Wheeler, Santa Clara, CA (US);

Lynn Thomas Van Erden, Livermore, CA (US);

H. Sam Bergh, San Francisco, CA (US);

Inventors:

Youqi Wang, Atherton, CA (US);

Peijun Cong, San Jose, CA (US);

Tony N. Wheeler, Santa Clara, CA (US);

Lynn Thomas Van Erden, Livermore, CA (US);

H. Sam Bergh, San Francisco, CA (US);

Assignee:

Symyx Technologies, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 31/10 (2006.01); G01N 1/22 (2006.01); G01N 35/10 (2006.01); H01J 49/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for sampling reaction products includes delivering a reactant through a sampling probe to contact a substance deposited on a substrate and reacting the reactant to form a reaction product. At least a portion of the reaction product is withdrawn through the sampling probe and analyzed. The sampling probe is contacted with the substrate during at least a portion of the delivering, reacting and withdrawing steps.


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