The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
Feb. 19, 2002
David Randall Yee, Burlingame, CA (US);
Daryl Geoffrey Porter, Danville, CA (US);
David Randall Yee, Burlingame, CA (US);
Daryl Geoffrey Porter, Danville, CA (US);
Oracle International Corporation, Redwood Shores, CA (US);
Abstract
A method, system, computer program product, and database connectivity layer provides the capability to capture data over time so that trend analysis may be performed that does not require modifications to the data model and the data processing applications. A method of automatically capturing data for trend analysis comprises the steps of: receiving a query for data from a database application, issuing the received query to a database management system, receiving a response to the query from the database management system, the response indicating a result dataset, creating or updating a database table that is suitable for trend analysis, and populating or updating the database table with data from the result dataset.