The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

Oct. 03, 2002
Applicant:

Michal Orkisz, Krakow, PL;

Inventor:

Michal Orkisz, Krakow, PL;

Assignee:

ABB SP.ZO.O., Warszawa, PL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 5/28 (2006.01); G01F 5/30 (2006.01); G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for detecting and automatically identifying defects in technical equipment, is disclosed. Measurement signals varying in time are downloaded as spectrograms to a computer memory. Using a predetermined criteria a set of designated peak values is created. Using another predetermined criteria the set of designated peak values is divided into two subsets. Then in one of the subsets, peak groups differing from each other by the basic frequency values are distinguished. The second subset, created from the set of designated peak values, is searched for the presence of sidebands for peaks from each specified peak group and if the sidebands are present the basic frequency of the sidebands is calculated. Then the existence of a defect in the technical equipment is detected, and identified by comparing the basic frequencies and the basic frequencies of the sidebands with the frequency values collected in the computer memory.


Find Patent Forward Citations

Loading…