The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
Aug. 30, 2002
Larry D. Barto, Austin, TX (US);
Yiwei LI, Austin, TX (US);
Steven C. Nettles, Johnson City, TX (US);
H. Van Dyke Parunak, Ann Arbor, MI (US);
Larry D. Barto, Austin, TX (US);
Yiwei Li, Austin, TX (US);
Steven C. Nettles, Johnson City, TX (US);
H. Van Dyke Parunak, Ann Arbor, MI (US);
Advanced Micro Devices, Inc., Austin, TX (US);
Abstract
A method includes providing a schedule of engagements for a resource. Each engagement has a working window and an associated engagement density function. The engagement density functions of the scheduled engagements are combined to generate a committed capacity function for the resource. A region of violation in the committed capacity function is identified where the committed capacity of the resource exceeds a capacity threshold. An area of a region of overlap between the working window of a selected one of the engagements and the region of violation is determined. An area reduction amount for the selected engagement is determined based on a portion of the area of the region of overlap. The working window of the selected engagement is changed based on the area reduction amount.