The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

Jan. 23, 2002
Applicant:

Shigeki Matsutani, Kanagawa, JP;

Inventor:

Shigeki Matsutani, Kanagawa, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An input coordinate sequence is acquired by sampling a handwritten input pattern at predetermined intervals, and a pattern expressed by this input coordinate sequence is approximated by coupling a plurality of line segments to attain line segment conversion. Adjacent angle data φ[i] is generated based on the directions of the respective line segments. At this time, the segment line length along line segments of all the line segments is divided by a predetermined value at equal intervals, and the angles obtained from the directions of the line segments at respective division positions are defined as φ[i]. This φ[i] is compared with a standard pattern (adjacent angle distribution data) prepared in advance to obtain a matching level. In this way, more accurate pattern matching for a handwritten input, which is approximately invariant to affine transformation and can reduce the influence of discretization errors can be implemented.


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