The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

Sep. 07, 2004
Applicants:

Tetsuo Ariyoshi, Kokubunji, JP;

Mariko Umeda, Tokyo, JP;

Takeshi Shimano, Tokorozawa, JP;

Inventors:

Tetsuo Ariyoshi, Kokubunji, JP;

Mariko Umeda, Tokyo, JP;

Takeshi Shimano, Tokorozawa, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

To stably carry out recording and reproducing to and from a high density optical disk without using a double servo in the optical disk using a high NA objective lens. A detection of a spherical aberration and a detection of a coma aberration in a radial direction are simultaneously performed, and the coma aberration generated with the offset of an objective lensis corrected in real time, thus enlarging an allowable offset amount of the objective lens. In order to simultaneously detect the spherical aberration and the coma aberration, focal shift and tracking shift signals in an inside region and outside region of reflected light flux are detected respectively, and the differential signals are set as spherical aberration and coma aberration signals.


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