The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
Jan. 17, 2002
Josef Beller, Tuebingen, DE;
Joachim Peerlings, Ehningen, DE;
Josef Beller, Tuebingen, DE;
Joachim Peerlings, Ehningen, DE;
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
An optical measuring device for providing a measurement of an optical device under test -DUT- comprises a measuring unit for providing an optical stimulus signal for the DUT and/or receiving a response signal of the DUT, and a visual fault localization unit for visually localizing faults within the DUT or a connection thereto. The measuring unit and the visual fault localization unit are preferably coupled to a signal direction unit, and the signal direction unit is further coupled to a connector representing an interface of the optical measuring device for coupling the DUT thereto.