The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

Apr. 01, 2004
Applicants:

Hrvoje Jasa, Scarborough, ME (US);

Gary D. Polhemus, Sebago, ME (US);

Kenneth Patrick Snowdon, Falmouth, ME (US);

Inventors:

Hrvoje Jasa, Scarborough, ME (US);

Gary D. Polhemus, Sebago, ME (US);

Kenneth Patrick Snowdon, Falmouth, ME (US);

Assignee:

Agere Systems Inc., Allentown, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A direct calibration technique significantly tightens a tolerance band between multiple voltage controlled oscillators (VCOs), to correct for slight frequency mismatch between the multiple VCOs. The tightened tolerance band enhances the bit error rate (BER) and/or lengthens the possible consecutive identical digits (CIDs) length, and is particularly useful in integrated circuit applications. A Frequency Locked Loop (FLL), an accumulator, and a DAC are implemented to form a calibration loop that becomes far more digital in nature than a PLL, permitting greater embedded circuit test coverage and ease of integration in VLSI digital technologies. A frequency calibrated loop with digital accumulator and DAC in lieu of a PLL with associated charge pump integrator eliminates the need for large integrated capacitors, sensitivity to drift due to the leakage currents associated with deep sub-micron technologies, and embedded analog voltages which generally cannot be tested.


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