The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
May. 22, 2001
David D. Y. Chen, Vancouver, CA;
Donald J. Douglas, Vancouver, CA;
Bradley B. Schneider, Bradford, CA;
David D. Y. Chen, Vancouver, CA;
Donald J. Douglas, Vancouver, CA;
Bradley B. Schneider, Bradford, CA;
The University of British Columbia, Vancouver, CA;
Abstract
An ion lens is used to focus ions produced by various types of ion sources which are substantially at atmospheric pressure. The ions are focused to the inlet of a downstream mass spectrometer or other devices which require a larger and more stable ion flux improved performance. The ion lens is mounted in close proximity to the sprayer tip. The ion lens increases the total ion count rate summed over all of the generated ions. The ion lens may also be employed to vary the degree of ion fragmentation and the charge state pattern of the generated ions. The ion lens may also result in a more stable ion signal. Furthermore, more than one ion lens may be used. This invention may also be extended to multisprayer ion sources.