The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
Sep. 30, 2002
BO U. Curry, Redwood City, CA (US);
Andreas N. Dorsel, Menlo Park, CA (US);
Jayati Ghosh, San Jose, CA (US);
Kenneth L. Staton, San Carlos, CA (US);
Bo U. Curry, Redwood City, CA (US);
Andreas N. Dorsel, Menlo Park, CA (US);
Jayati Ghosh, San Jose, CA (US);
Kenneth L. Staton, San Carlos, CA (US);
Agilent Technologies, Inc., Palo Alto, CA (US);
Abstract
Automated methods and systems for determining an in-focus-distance for a position on the surface of a molecular array substrate using a molecular array scanner are provided. A signal from a first position of an array substrate is detected and noise is filtered out of the detected signal using a symmetrical filter to produce an in-focus-distance. In one embodiment, the in-focus-distance is utilized as an estimated in-focus-distance at a second position of the array substrate. The method finds use in maintaining the focus of a light source while scanning the array by the scanner. Also provided are methods of assaying a sample using the methods and systems of the invention, and kits for performing the invention. The subject invention finds use in a variety of different applications, including both genomics and proteomics applications.