The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
Jan. 06, 2004
Itaru Furukawa, Kyoto, JP;
Takashi Mouri, Kyoto, JP;
Itaru Furukawa, Kyoto, JP;
Takashi Mouri, Kyoto, JP;
Dainippon Screen Mfg. Co., Ltd., Kyoto, JP;
Abstract
A sharpness conversion part is provided in a print inspection apparatus and performs an average-masking operation to weaken a sharpness of object image data to be inspected and that of reference image data. After that, a differential value between these data is acquired. With this operation, an inspection for printing is performed by using image data of which the difference is distinguishable by human's visual property, not considering an invisible differential value which is caused by pixel displacement in subpixel order, and it is therefore possible to efficiently obtain a print inspection result with an accuracy almost as high as that by visual inspection. Thus, a print inspection apparatus can be provided, which is capable of correctly extracting difference to be detected by visual check.