The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

May. 25, 2001
Applicant:

Ryoichi Matsumoto, Tokyo, JP;

Inventor:

Ryoichi Matsumoto, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/06 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for manufacturing a semiconductor device suppresses electric charge charged up in a semiconductor layer of an SOI substrate at the time of ion implantation, preventing a BOX layer and a gate oxide from being damaged. A field oxide film is formed on a semiconductor layer formed on a BOX layer. A conductive layer is formed on the field oxide film and a gate oxide film as well. The conductive layer made of amorphous carbon is formed by sputtering and has a thickness of 5 nm to 10 nm. B+ is implanted in the interface between the semiconductor layer and the gate oxide film by an intermediate dose ion implanter. The electric charge generated in the semiconductor layer at the time of ion implantation results in FN current, which is removed through the gate oxide film and the conductive layer.


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