The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 27, 2006

Filed:

Dec. 23, 2003
Applicants:

Yong-hua Chen, Newtown, CT (US);

Tarek M. Habashy, Danbury, CT (US);

Inventors:

Yong-Hua Chen, Newtown, CT (US);

Tarek M. Habashy, Danbury, CT (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
E21B 47/01 (2006.01);
U.S. Cl.
CPC ...
Abstract

Tools for investigating an earth formation in the presence of either oil-base or water-base mud include a circuit which induces current into the formation in a focused manner, and a sensor electrode which is isolated from the circuit, at least partially surrounded by the circuit, and located in the area in which the current is focused. The current inducing circuit may be an oppositely polarized double-dipole circuit to which voltage is applied with the two dipoles sharing a common radiating element over which a focused area is formed. Insulators separate the outer electrodes of the double-dipole circuit from the common radiating element. Alternatively, the current inducing circuit is a coil arranged in a partial toroidal configuration in an insulated area that at least partially surrounds the focused area and which separates the focused area from return electrodes.


Find Patent Forward Citations

Chen, Yong-Hua. (2006). Apparatus and methods for measuring formation characteristics in presence of conductive and non-conductive muds (U.S. Patent No. 7066282). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7066282

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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