The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 27, 2006
Filed:
Aug. 20, 2002
Applicants:
Jorma Keskinen, Tampere, FI;
Marko Marjamäki, Tampere, FI;
Mikko Moisio, Tampere, FI;
Jyrki Ristimäki, Tampere, FI;
Annele Virtanen, Tampere, FI;
Inventors:
Jorma Keskinen, Tampere, FI;
Marko Marjamäki, Tampere, FI;
Mikko Moisio, Tampere, FI;
Jyrki Ristimäki, Tampere, FI;
Annele Virtanen, Tampere, FI;
Assignee:
Dekati Oy, Tampere, FI;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 15/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and a device for measuring properties of a particle distribution, in which a parameter relating to the mobility of the particles is measured at one measuring point () and a parameter relating to the aerodynamic size of the particles is measured at a second measuring point (). By means of the measured parameters, at least one property of the particle distribution of the original flow is determined ().