The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2006

Filed:

Dec. 21, 2001
Applicants:

Akihiko Matsuo, Kawasaki, JP;

Kyoko Ohashi, Kawasaki, JP;

Rieko Yamamoto, Kawasaki, JP;

Inventors:

Akihiko Matsuo, Kawasaki, JP;

Kyoko Ohashi, Kawasaki, JP;

Rieko Yamamoto, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/44 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test specification formation supporting apparatus is constructed by a test factor classification table forming unit and a test specification forming unit. The test factor classification table forming unit analyzes design information of a class of software designed by an object orientation and forms a template of a test factor classification table in which test factors which influence the operation of a method of a test target and conditions of the test factors have been listed. The test specification forming unit forms a test specification by combining the conditions described in the test factor classification table completed on the basis of the template of the test factor classification table.


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