The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2006

Filed:

Mar. 30, 2001
Applicant:

Edmund G. Lee, Palo Alto, CA (US);

Inventor:

Edmund G. Lee, Palo Alto, CA (US);

Assignee:

Pharsight Corporation, Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/30 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods are disclosed for identifying and/or compensating for relationships between influencers and outcomes. First, a metadata model of information that characterizes relationships between influencers and outcomes is built. A query is accepted from a user, and an outcome of interest is determined based on the query. The model is subsequently relied on to flag influencers that might have an impact on an outcome of interest. The impact of these influencers on the outcome of interest is then analyzed with respect to specific conditions. When the impact is sufficiently large, the user is notified or an adjustment is made to the user's query.


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