The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2006
Filed:
May. 28, 2003
Kevin Moermond, Cincinnati, OH (US);
Andy Joseph Galish, West Chester, OH (US);
John Robert Brehm, Middletown, OH (US);
Francis Howard Little, Cincinnati, OH (US);
Dean Fredrich Graber, Hamilton, OH (US);
Michael Timothy LA Tulippe, Fairfield, OH (US);
Ronald Cecil Mcfarland, Cincinnati, OH (US);
Kevin Moermond, Cincinnati, OH (US);
Andy Joseph Galish, West Chester, OH (US);
John Robert Brehm, Middletown, OH (US);
Francis Howard Little, Cincinnati, OH (US);
Dean Fredrich Graber, Hamilton, OH (US);
Michael Timothy La Tulippe, Fairfield, OH (US);
Ronald Cecil McFarland, Cincinnati, OH (US);
General Electric Company, Schenectady, NY (US);
Abstract
A system and method to inspect a component is disclosed. The system to inspect a component may include an x-ray source to direct an x-ray beam through the component and an x-ray detector to detect the x-ray beam after passing through the component. A processor may be included to transform coordinates on an x-ray detection panel of the x-ray detector that detect any defects to a digital representation of locations on the component of any defects.