The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2006

Filed:

Jan. 31, 2001
Applicants:

Hideki Morishima, Kawasaki, JP;

Hiroshi Nishihara, Yokohama, JP;

Naosato Taniguchi, Urawa, JP;

Tomoshi Takikawa, Yokohama, JP;

Yoshihiro Saito, Tokyo, JP;

Kazutaka Inoguchi, Kawasaki, JP;

Inventors:

Hideki Morishima, Kawasaki, JP;

Hiroshi Nishihara, Yokohama, JP;

Naosato Taniguchi, Urawa, JP;

Tomoshi Takikawa, Yokohama, JP;

Yoshihiro Saito, Tokyo, JP;

Kazutaka Inoguchi, Kawasaki, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 27/22 (2006.01); H04N 13/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

Parallax images corresponding to a plurality of different view points are each divided into predetermined stripe images, a synthetic parallax image is synthesized from the stripe images, and display light, from stripe images corresponding to one view point of the synthetic parallax image on the image display element displaying the synthetic parallax image, is guided to a mask member having a mask pattern with predetermined openings and shields by a second optical system placed in front of the image display element. The display light passing through the openings of the mask member is condensed to a position corresponding to the view point on an observation surface a predetermined distance apart, by a first optical system, whereby an observer is permitted to stereoscopically observe image information displayed on the image display element.


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