The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2006

Filed:

Oct. 06, 2003
Applicant:

Fumihiko Ito, Tokyo, JP;

Inventor:

Fumihiko Ito, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

The optical sampling system performs by detecting the interference effect which is a linear correlation between the signal lights and the optical pulses, so that both the signal lights and the optical pulses can have relatively low intensities, and the reception sensitivity is high. Also, the pulse width of the optical pulses and the amount of delay given to the optical pulses are the only factors that limit the time resolution, so that it is possible to provide the optical sampling system with excellent time resolution and power consumption properties, and it is possible for the optical sampling system to monitor not only the intensity of the signal lights but also the frequency modulation component as well.


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