The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2006
Filed:
Apr. 30, 2003
Paul E Bussard, Santa Rosa, CA (US);
Mark D Zinser, Vancouver, WA (US);
James R Stimple, Santa Rosa, CA (US);
Jeffrey Elmer Pape, Santa Rosa, CA (US);
Paul E Bussard, Santa Rosa, CA (US);
Mark D Zinser, Vancouver, WA (US);
James R Stimple, Santa Rosa, CA (US);
Jeffrey Elmer Pape, Santa Rosa, CA (US);
Agilent Technologies Inc., Palo Alto, CA (US);
Abstract
An optical phase standard includes a coupler dividing an applied optical signal between a measurement interferometer and a frequency reference branch. Resulting signals at the outputs of the measurement interferometer and the frequency reference branch are sampled. The samples acquired at the output of the frequency reference branch are mapped to optical frequencies that are traceable to a frequency standard provided by an absorption cell. This mapping determines the optical frequencies at which the samples acquired are at the output of the measurement interferometer. From the acquired samples at the output of the measurement interferometer, phase characteristics of a device under test (DUT) are extracted. Aspects of the optical phase standard are alternatively implemented according to an optical phase standardization method.