The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7064815 B1

PDF
Full Text
Expired
Date of Patent:
Jun. 20, 2006

Filed:

Nov. 23, 2004
Applicants:

Michiaki Hayashi, Kamifukuoka, JP;

Hideaki Tanaka, Kamifukuoka, JP;

Inventors:

Michiaki Hayashi, Kamifukuoka, JP;

Hideaki Tanaka, Kamifukuoka, JP;

Assignee:

KDDI Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test signal light intensity-modulated with a test data is generated and enters the optical transmission line. An extractor extracts the first and second optical components from the test signal light output from the optical transmission line, the first and second optical components composed of any one of a main signal light component, an upper sideband component, and/or a lower sideband component. A time difference measuring apparatus measures a time difference between the first and second optical components. A converter converts the measured time difference into a chromatic dispersion value.


Find Patent Forward Citations

Hayashi, Michiaki. (2006). Method and apparatus for measuring chromatic dispersion (U.S. Patent No. 7064815). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7064815

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