The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2006
Filed:
May. 17, 2001
Applicants:
Marko Hahn, Petershagen, DE;
Dirk Wendel, Unterhaching, DE;
Ulrich Niedermeier, München, DE;
Inventors:
Assignee:
Micronas GmbH, Freiburg, DE;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N 17/00 (2006.01); H04N 17/02 (2006.01); H04N 5/21 (2006.01); H04N 5/213 (2006.01); H04N 5/217 (2006.01);
U.S. Cl.
CPC ...
Abstract
To determine the noise contained in a picture, it is proposed first to determine homogeneous picture regions of the picture () and then to measure the high-frequency signal component in these homogeneous picture regions (BR). The measurement of the high-frequency signal components is here averaged over many measurement points, i.e. over many homogenous picture regions (BR), and is processed into a noise figure (NOISE_SUM) (). In this way, the quality of the picture can be measured directly in the picture content.