The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2006
Filed:
Aug. 31, 2004
Bradley Frederick Baumgartner, Los Banos, CA (US);
Norman Chu, San Francisco, CA (US);
Patricia Galindo, Morgan Hill, CA (US);
Hang Fai Ngo, San Jose, CA (US);
Yu Lo, Foster City, CA (US);
Nalin Zhou, San Jose, CA (US);
Bradley Frederick Baumgartner, Los Banos, CA (US);
Norman Chu, San Francisco, CA (US);
Patricia Galindo, Morgan Hill, CA (US);
Hang Fai Ngo, San Jose, CA (US);
Yu Lo, Foster City, CA (US);
Nalin Zhou, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
A method is presented for glide testing a disk which tests the glide head fly-height by inducing a collision between the glide head and a disk under test. The glide test system is initially calibrated using calibration disks. The method of the invention periodically tests the calibration without interrupting the production testing by lowering the rotation rate until the glide head collides with the rotating disk surface. The rotation rate at which the collision occurs is then compared with the value expected based on knowledge of disk samples and the initial calibration. Parameters for acceptable high and low values are established to detect changes in the glide test system performance to trigger automatic or manual recalibration.