The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 20, 2006
Filed:
Nov. 04, 2003
Applicant:
Michael Evan Webber, Culver City, CA (US);
Inventor:
Michael Evan Webber, Culver City, CA (US);
Assignee:
Franalytica, Inc., Santa Monica, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/35 (2006.01);
U.S. Cl.
CPC ...
Abstract
An amplifier-enhanced optical analysis system and method to optically analyze a molecular component of a gas, liquid, or solid. The amplifier-enhanced optical system comprises a laser, a light amplifier, and an optical analysis means, all optically coupled so that light at a predetermined wavelength in the near-infrared spectrum is transported from the laser, through the light amplifier, and to the optical analysis means, wherein the predetermined wavelength corresponds to an absorption feature of the molecular component. Optical analysis means preferably comprises photoacoustic analysis equipment.