The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Apr. 17, 2003
Applicants:
James Sweet, Sunnyvale, CA (US);
Amar Guettaf, Sunnyvale, CA (US);
Inventors:
James Sweet, Sunnyvale, CA (US);
Amar Guettaf, Sunnyvale, CA (US);
Assignee:
Broadcom Corporation, Irvine, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus are disclosed for easily reconfiguring a scan chain test of a subset of scan blocks within a digital integrated circuit chip. To mitigate timing violations in the scan test of scan chains, alternative embodiments to implement a transfer of scan data to a next scan block are implemented.
Sweet, James. (2006). Methodology for selectively testing portions of an integrated circuit (U.S. Patent No. 7062693). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7062693
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile