The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Jul. 18, 2001
Wolfgang Ernst, München, DE;
Gunnar Krause, München, DE;
Justus Kuhn, München, DE;
Jens Lüpke, München, DE;
Jochen Müller, München, DE;
Peter Pöchmüller, München, DE;
Michael Schittenhelm, Poing, DE;
Wolfgang Ernst, München, DE;
Gunnar Krause, München, DE;
Justus Kuhn, München, DE;
Jens Lüpke, München, DE;
Jochen Müller, München, DE;
Peter Pöchmüller, München, DE;
Michael Schittenhelm, Poing, DE;
Infineon Technologies AG, Munich, DE;
Abstract
A system and a method for testing fast synchronous digital circuit with an additional built outside self test semiconductor chip disposed between a test device and circuit under test. The chip has a switching/detection unit that tests the chip based on external criteria between a first normal operating mode in which the chip tests the circuit to be tested, and a second operating mode in which programmable registers of the register unit of a receiver of the chip are programmed by the external test device. The registers store constants and variables for generating the test signals and for evaluating them. The chip generates test signals and transceiver for sending the test signals and receiving response signals generated thereby.