The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Jan. 08, 2002
G. William Walster, Cupertino, CA (US);
Eldon R. Hansen, Los Altos, CA (US);
G. William Walster, Cupertino, CA (US);
Eldon R. Hansen, Los Altos, CA (US);
Sun Microsystems, Inc, Santa Clara, CA (US);
Abstract
A system that solves a global inequality constrained optimization problem specified by a function ƒ and a set of inequality constraints p(x)≦0(i=1, . . . , m), wherein ƒ and pare scalar functions of a vector x=(x, x, x, . . . x). The system performs an interval inequality constrained global optimization process to compute guaranteed bounds on a globally minimum value of the function ƒ(x) subject to the set of inequality constraints. The system applies term consistency and box consistency to a set of relations associated with the global inequality constrained optimization problem over a subbox X, and excludes any portion of the subbox X that violates the set of relations. The system also performs an interval Newton step on the subbox X to produce a resulting subbox Y. The system integrates the sub-parts of the process with branch tests designed to increase the overall speed of the process.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile