The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 13, 2006

Filed:

Jul. 17, 2001
Applicants:

Shantanu V. Kaushikkar, San Jose, CA (US);

Nathan K. Weiner, Stoughton, MA (US);

Eric E. Mckenzie, Malden, MA (US);

John C. Stephens, Boulder Creek, CA (US);

Inventors:

Shantanu V. Kaushikkar, San Jose, CA (US);

Nathan K. Weiner, Stoughton, MA (US);

Eric E. McKenzie, Malden, MA (US);

John C. Stephens, Boulder Creek, CA (US);

Assignee:

Affymetrix, Inc., Santa Clara, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/74 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems, methods, and computer program products are described for adjusting the gain of a scanner. The scanner includes one or more excitation sources, an emission detector having a first gain, and a variable gain element having a second gain. One described method includes receiving a user-selected gain value, adjusting the first gain based on a first portion of the user-selected gain value, and adjusting the second gain based on a second portion of the user-selected gain value. Another described method includes selecting an auto-gain value, adjusting the first gain based on a first portion of the auto-gain value, adjusting the second gain based on a second portion of the auto-gain value, causing the scanner to collect sample pixel intensity values, determining a comparison measure based on comparing the sample pixel intensity values to desired pixel intensity values, and adjusting the auto-gain value based on the comparison measure.


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