The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 13, 2006
Filed:
Feb. 14, 2003
Michael Mittelstein, Laguna Niguel, CA (US);
Hongmin Chen, Worcester, MA (US);
Michael Mittelstein, Laguna Niguel, CA (US);
Hongmin Chen, Worcester, MA (US);
Technology Asset Trust, Placentia, CA (US);
Abstract
A method and device for measuring the wavelength of a source, for example monitoring a laser used in DWDM fiber optic communications systems, wherein the method and device comprise using a coarse arrayed waveguide grating (AWG) to resolve an ambiguity of wavelength measurement in a fine arrayed waveguide grating. The wavelength monitor or meter of the present invention may be configured as a standalone device suitable for use in many different applications and may also be integrated into a laser or laser array for use in DWDM fiber optic communications systems.